KERKAR, Fouad; OUADJAOUT, Djamel; KHELIFATI, Nabil; MAOUDJ, Mohamed. Electrical Resistivity and Minority Carrier Lifetime Distribution in Directional Solidification of Silicon Ingot. International Journal of Computational and Experimental Science and Engineering, [S. l.], v. 11, n. 4, 2025. DOI: 10.22399/ijcesen.4137. Disponível em: https://ijcesen.com/index.php/ijcesen/article/view/4137. Acesso em: 4 nov. 2025.