MANGUKIYA, Milan. Advanced testing and validation frameworks for high-reliability multi-board electronic systems. International Journal of Computational and Experimental Science and Engineering, [S. l.], v. 11, n. 4, 2025. DOI: 10.22399/ijcesen.4719. Disponível em: https://ijcesen.com/index.php/ijcesen/article/view/4719. Acesso em: 24 mar. 2026.