AMIT KUMAR. Comparative Study of UVM and ML-Infused Methodologies for Next-Gen SoC Storage Verification. International Journal of Computational and Experimental Science and Engineering, [S. l.], v. 12, n. 3, 2026. DOI: 10.22399/ijcesen.5420. Disponível em: https://ijcesen.com/index.php/ijcesen/article/view/5420. Acesso em: 19 oct. 2026.