Enhancing Reliability in Complex Embedded Systems Software: The Critical Role of Unit Testing in the Age of AI and Machine Learning

Authors

  • Kishore Ranjan Research Scholar
  • Reena Chandra
  • Karan Lulla

DOI:

https://doi.org/10.22399/ijcesen.2633

Keywords:

Embedded Systems, AI, CI/CD, Unit tests, integration tests, software quality

Abstract

Qualification of a large code base embedded software systems, like Lithography machines, Aerospace Embedded Systems, High-End Medical Embedded Systems & Automotive Embedded Systems, is an important and challenging aspect. The goal of this article is to provide a brief description of large code base software qualification in embedded systems and how “Unit Tests” can make a huge difference. This research addresses the importance of qualification and automation in embedded system devices to improve the software quality of source code by introducing appropriate test strategy at right place to improve the quality of final product and at a low maintenance cost. This article will focus more on the importance of unit tests in the software development lifecycle, and how the advance AI tools and CI/CD concepts are used across industry is enabling it.

References

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[3]Unit Testing For Embedded Software Developmenthttps://dojofive.com/blog/unit-testing-for-embedded-software-development/

[4] For TDD on embedded systems, see Test Driven Development for Embedded C, by James Grenning.

[5]:https://www.datacenterdynamics.com/en/news/tsmc-to-receive-first-high-na-euv-lithography-machine-from-asml-in-q4/#:~:text=It%20is%20unclear%20how%20many,advanced%203nm%20and%205nm%20chips

[6] Q. Liao, Modelling CI/CD Pipeline Through Agent-Based Simulation,”2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW), Coimbra, Portugal, 2020, pp.155-156, doi: 10.1109/ISSREW51248.2020.00059 DOI: https://doi.org/10.1109/ISSREW51248.2020.00059

[7] D. V. Landuyt, L. Sion, W. Philips and W. Joosen, ”From automation to CI/CD: a comparative evaluation of threat modeling tools,” 2024 IEEE Secure Development Conference (SecDev), Pittsburgh, PA, USA, 2024, pp. 35-45, doi: 10.1109/SecDev61143.2024.00010. DOI: https://doi.org/10.1109/SecDev61143.2024.00010

[8] A. Saxena, S. Singh, S. Prakash, T. Yang and R. S. Rathore, ”DevOps Automation Pipeline Deployment with IaC (Infrastructure as Code),”2024 IEEE Silchar Subsection Conference (SILCON 2024), Agartala, India, 2024, pp. 1-6, doi: 10.1109/SILCON63976.2024.10910699 DOI: https://doi.org/10.1109/SILCON63976.2024.10910699

[9] Reinforcement Learning from Automatic Feedback for High-Quality Unit Test Generation Benjamin Steenhoek, Michele Tufano, Neel Sundaresan, Alexey Svyatkovskiy https://doi.org/10.48550/arXiv.2412.14308

[10] VALTEST: Automated Validation of Language Model Generated Test Cases Hamed Taherkhani, Hadi Hemmati

https://doi.org/10.48550/arXiv.2411.08254

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Published

2025-06-08

How to Cite

Ranjan, K., Reena Chandra, & Karan Lulla. (2025). Enhancing Reliability in Complex Embedded Systems Software: The Critical Role of Unit Testing in the Age of AI and Machine Learning. International Journal of Computational and Experimental Science and Engineering, 11(3). https://doi.org/10.22399/ijcesen.2633

Issue

Vol. 11 No. 3 (2025): IJCESEN

Section

Research Article

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Copyright (c) 2025 International Journal of Computational and Experimental Science and Engineering

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This work is licensed under a Creative Commons Attribution 4.0 International License.